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Temporal Speckle Pattern Interferometry

C. Joenathan, Dept. of Physics and Applied Optics, Rose-Hulman Institute of Tech, Terre Haute, IN; P. Haible and H.J. Tiziani, Universität Stuttgart, Institut für Technische Optik, Stuttgart, Germany.

In recent years, speckle techniques have been propelled from scientific to industrial environments due to rapid advancements in computer technology and its peripherals. In many ways, the limited use of speckle techniques is set by its relatively high sensitivity, thereby only displacements in the range of 5-6 μm can be measured. Recent developments to record the temporal fluctuation of speckles rather than changes in spatial distribution have rendered the possibility of measuring large displacements over 100 μm with almost the same accuracy as using phase shifting techniques.