Feature
Test and Measurement: Spatial Profile, Power, Wavelength and Linewidth Measurement Computerizations Alternatives
Forrest discusses the trade-offs of stand-alone instruments versus integrated measurement systems for the measurement of beam power, spatial distribution, linewidth, and wavelength parameters. He also anticipates future trends in computerized instrumentation.
Log in or become a member to view the full text of this article.
This article may be available for purchase via the search at Optica Publishing Group.
Optica Members get the full text of Optics & Photonics News, plus a variety of other member benefits.